A new linear transfer theory and characterization method for image detectors. Part I: Theory

T Niermann; A Lubk; F Roder

doi:10.1016/j.ultramic.2012.01.012

A new linear transfer theory and characterization method for image detectors. Part I: Theory

T Niermann, A Lubk, F Roder

Research output: Contribution to journal › Original Article › peer-review

14 Citations (Web of Science)

Original language	English
Pages (from-to)	68-77
Journal	ULTRAMICROSCOPY
Volume	115
DOIs	https://doi.org/10.1016/j.ultramic.2012.01.012
Publication status	Published - 2012

Keywords

MAXIMUM-LIKELIHOOD-ESTIMATION
DETECTIVE QUANTUM EFFICIENCY
ELECTRON-MICROSCOPY IMAGES
STRUCTURE PARAMETERS
CCD CAMERAS
SYSTEMS
NOISE
OPTIMIZATION
PERFORMANCE
HOLOGRAPHY

Access to Document

10.1016/j.ultramic.2012.01.012

Cite this

@article{f02a510dcd384828bd0b68ac794ced98,

title = "A new linear transfer theory and characterization method for image detectors. Part I: Theory",

keywords = "MAXIMUM-LIKELIHOOD-ESTIMATION, DETECTIVE QUANTUM EFFICIENCY, ELECTRON-MICROSCOPY IMAGES, STRUCTURE PARAMETERS, CCD CAMERAS, SYSTEMS, NOISE, OPTIMIZATION, PERFORMANCE, HOLOGRAPHY",

author = "T Niermann and A Lubk and F Roder",

year = "2012",

doi = "10.1016/j.ultramic.2012.01.012",

language = "English",

volume = "115",

pages = "68--77",

journal = "ULTRAMICROSCOPY",

issn = "0304-3991",

}

TY - JOUR

T1 - A new linear transfer theory and characterization method for image detectors. Part I: Theory

AU - Niermann, T

AU - Lubk, A

AU - Roder, F

PY - 2012

Y1 - 2012

KW - MAXIMUM-LIKELIHOOD-ESTIMATION

KW - DETECTIVE QUANTUM EFFICIENCY

KW - ELECTRON-MICROSCOPY IMAGES

KW - STRUCTURE PARAMETERS

KW - CCD CAMERAS

KW - SYSTEMS

KW - NOISE

KW - OPTIMIZATION

KW - PERFORMANCE

KW - HOLOGRAPHY

U2 - 10.1016/j.ultramic.2012.01.012

DO - 10.1016/j.ultramic.2012.01.012

M3 - Original Article

C2 - 22465093

SN - 0304-3991

VL - 115

SP - 68

EP - 77

JO - ULTRAMICROSCOPY

JF - ULTRAMICROSCOPY

ER -